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ORCID"Reliability Investigation of GaN HEMTs for MMICs Applications."
Alessandro Chini et al. (2014)
- Alessandro Chini
, Gaudenzio Meneghesso, Alessio Pantellini, Claudio Lanzieri, Enrico Zanoni:
Reliability Investigation of GaN HEMTs for MMICs Applications. Micromachines 5(3): 570-582 (2014)
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