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"A Hierarchical Test Methodology for Systems on Chip."

Jin-Fu Li et al. (2002)

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DOI: 10.1109/MM.2002.1044301

access: closed

type: Journal Article

metadata version: 2023-10-17

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  dblp key:
  - journals/micro/LiHCSWCCHL02
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  persistent URL:
  - https://dblp.org/rec/journals/micro/LiHCSWCCHL02
Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin:
A Hierarchical Test Methodology for Systems on Chip. IEEE Micro 22(5): 69-81 (2002)

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