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"SAT-based generation of compressed skewed-load tests for transition delay ..."

Roland Dobai, Marcel Baláz (2013)

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DOI: 10.1016/J.MICPRO.2012.09.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Roland Dobai, Marcel Baláz:
SAT-based generation of compressed skewed-load tests for transition delay faults. Microprocess. Microsystems 37(2): 196-205 (2013)

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