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"Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology."

Liang-Teck Pang et al. (2009)

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DOI: 10.1109/JSSC.2009.2022217

access: closed

type: Journal Article

metadata version: 2020-08-30

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  - https://dblp.org/rec/journals/jssc/PangQSN09
Liang-Teck Pang, Kun Qian, Costas J. Spanos, Borivoje Nikolic:
Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology. IEEE J. Solid State Circuits 44(8): 2233-2243 (2009)

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