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"BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM ..."

Young-Chan Jang et al. (2009)

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DOI: 10.1109/JSSC.2009.2028948

access: closed

type: Journal Article

metadata version: 2022-02-28

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  - https://dblp.org/rec/journals/jssc/JangCCPKLSPKKLK09
Young-Chan Jang, Hoeju Chung, Youngdon Choi, Hwan-Wook Park, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Moon-Sook Park, Hyung-Seuk Kim, Sang-Yun Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Jei-Hwan Yoo, Changhyun Kim:
BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel. IEEE J. Solid State Circuits 44(11): 2987-2998 (2009)

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