![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
"Large-Scale SRAM Variability Characterization in 45 nm CMOS."
Zheng Guo et al. (2009)
- Zheng Guo, Andrew Carlson, Liang-Teck Pang, Kenneth Duong, Tsu-Jae King Liu, Borivoje Nikolic
:
Large-Scale SRAM Variability Characterization in 45 nm CMOS. IEEE J. Solid State Circuits 44(11): 3174-3192 (2009)
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.