"Effects of Lightly Doped Drain and Channel Doping Variations on Flash ..."

Guillaume Just et al. (2012)

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DOI: 10.1166/JOLPE.2012.1230

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type: Journal Article

metadata version: 2021-12-24

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Guillaume Just, Vincenzo Della Marca, Arnaud Régnier, Jean-Luc Ogier, Jérémy Postel-Pellerin, Jean-Michel Portal, Pascal Masson:
Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability. J. Low Power Electron. 8(5): 717-724 (2012)

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