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"Reliability analysis for flexible electronics: Case study of integrated ..."

Tsung-Ching Huang et al. (2008)

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DOI: 10.1145/1389089.1389092

access: closed

type: Journal Article

metadata version: 2022-12-07

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Tsung-Ching Huang, Kwang-Ting (Tim) Cheng, Huai-Yuan Tseng, Chen-Pang Kung:
Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. ACM J. Emerg. Technol. Comput. Syst. 4(3): 12:1-12:23 (2008)

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