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"Built-in Self-Test and Fault Localization for Inter-Layer Vias in ..."

Arjun Chaudhuri et al. (2022)

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DOI: 10.1145/3464430

access: closed

type: Journal Article

metadata version: 2022-01-13

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  - journals/jetc/ChaudhuriBKPKKC22
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  - https://dblp.org/rec/journals/jetc/ChaudhuriBKPKKC22
Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim:
Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs. ACM J. Emerg. Technol. Comput. Syst. 18(1): 22:1-22:37 (2022)

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