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"Leakage Current Optimization Techniques During Test Based on Don't Care ..."
Wei Wang et al. (2007)
- Wei Wang, Yu Hu, Yinhe Han, Xiaowei Li, You-Sheng Zhang:
Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment. J. Comput. Sci. Technol. 22(5): 673-680 (2007)
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