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"Small Test Set Generation with High Diagnosability."

Anupam Bhar et al. (2016)

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DOI: 10.1142/S0218126616500249

access: closed

type: Journal Article

metadata version: 2020-08-25

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  dblp key:
  - journals/jcsc/BharCSK16
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  - https://dblp.org/rec/journals/jcsc/BharCSK16
Anupam Bhar, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
Small Test Set Generation with High Diagnosability. J. Circuits Syst. Comput. 25(4): 1650024:1-1650024:18 (2016)

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