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"A Counter-based Read Circuit Tolerant to Process Variation for 0.4-V ..."
Yohei Umeki et al. (2016)
- Yohei Umeki, Koji Yanagida, Shusuke Yoshimoto, Shintaro Izumi, Masahiko Yoshimoto, Hiroshi Kawaguchi
, Koji Tsunoda, Toshihiro Sugii:
A Counter-based Read Circuit Tolerant to Process Variation for 0.4-V Operating STT-MRAM. IPSJ Trans. Syst. LSI Des. Methodol. 9: 79-83 (2016)

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