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"Secure split test techniques to prevent IC piracy for IoT devices."

K. Sudeendra Kumar et al. (2017)

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DOI: 10.1016/J.VLSI.2016.09.004

access: closed

type: Journal Article

metadata version: 2020-02-20

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K. Sudeendra Kumar, G. Hanumanta Rao, Sauvagya Ranjan Sahoo, Kamala Kanta Mahapatra:
Secure split test techniques to prevent IC piracy for IoT devices. Integr. 58: 390-400 (2017)

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