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"Statistical full-chip total power estimation considering spatially ..."

Zhigang Hao, Sheldon X.-D. Tan, Guoyong Shi (2013)

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DOI: 10.1016/J.VLSI.2011.12.004

access: closed

type: Journal Article

metadata version: 2020-02-20

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Zhigang Hao, Sheldon X.-D. Tan, Guoyong Shi:
Statistical full-chip total power estimation considering spatially correlated process variations. Integr. 46(1): 80-88 (2013)

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