"Semi-empirical RF MOST model for CMOS 65 nm technologies: Theory, ..."

Rafaella Fiorelli, Eduardo J. Peralías (2016)

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DOI: 10.1016/J.VLSI.2015.07.018

access: closed

type: Journal Article

metadata version: 2020-02-20

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Rafaella Fiorelli, Eduardo J. Peralías:
Semi-empirical RF MOST model for CMOS 65 nm technologies: Theory, extraction method and validation. Integr. 52: 228-236 (2016)

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