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"Test generation and fault detection for VLSI PPL circuits."

Alaaeldin A. M. Amin, Kent F. Smith (1989)

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DOI: 10.1016/0167-9260(89)90007-2

access: closed

type: Journal Article

metadata version: 2020-02-20

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Alaaeldin A. M. Amin, Kent F. Smith:
Test generation and fault detection for VLSI PPL circuits. Integr. 7(3): 303-324 (1989)

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