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"Sensing margin trend with technology scaling in MRAM."

Jee-Hwan Song et al. (2011)

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DOI: 10.1002/CTA.635

access: closed

type: Journal Article

metadata version: 2020-05-11

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  - https://dblp.org/rec/journals/ijcta/SongKKYJ11
Jee-Hwan Song, Jisu Kim, Seung-Hyuk Kang, Sei-Seung Yoon, Seong-Ook Jung:
Sensing margin trend with technology scaling in MRAM. Int. J. Circuit Theory Appl. 39(3): 313-325 (2011)

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