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"Variability analysis of resistive ternary content addressable memories."
Mohamed A. Bahloul et al. (2021)
- Mohamed A. Bahloul, Mohammed E. Fouda, Imen Barraj, Mohamed Masmoudi:
Variability analysis of resistive ternary content addressable memories. Int. J. Circuit Theory Appl. 49(2): 453-475 (2021)
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