"High-Sensitive Detection of Electronic Emission through ..."

Daichi Takeuchi et al. (2014)

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DOI: 10.1587/TRANSELE.E97.C.397

access: closed

type: Journal Article

metadata version: 2020-04-11

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Daichi Takeuchi, Katsunori Makihara, Mitsuhisa Ikeda, Seiichi Miyazaki, Hirokazu Kaki, Tsukasa Hayashi:
High-Sensitive Detection of Electronic Emission through Si-Nanocrystals/Si-Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy. IEICE Trans. Electron. 97-C(5): 397-400 (2014)

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