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"Soft-Error-Tolerant Dual-Modular-Redundancy Architecture with Repair and ..."

Makoto Saen, Tadanobu Toba, Yusuke Kanno (2017)

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DOI: 10.1587/TRANSELE.E100.C.382

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/SaenTK17
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/SaenTK17
Makoto Saen, Tadanobu Toba, Yusuke Kanno:
Soft-Error-Tolerant Dual-Modular-Redundancy Architecture with Repair and Retry Scheme for Memory-Control Circuit on FPGA. IEICE Trans. Electron. 100-C(4): 382-390 (2017)

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