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"Error Propagation Analysis for Single Event Upset considering Masking ..."

Go Matsukawa et al. (2016)

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DOI: 10.1587/TRANSFUN.E99.A.1198

access: closed

type: Journal Article

metadata version: 2024-03-11

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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/MatsukawaKYIKY16
Go Matsukawa, Yuta Kimi, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto:
Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(6): 1198-1205 (2016)

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