"A High-Throughput On-Chip Variation Monitoring Circuit for MOSFET ..."

Jae-Seung Lee, Jae-Yoon Sim, Hong-June Park (2010)

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DOI: 10.1587/TRANSELE.E93.C.1333

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/LeeSP10
Jae-Seung Lee, Jae-Yoon Sim, Hong-June Park:
A High-Throughput On-Chip Variation Monitoring Circuit for MOSFET Threshold Voltage Using VCDL and Time-to-Digital Converter. IEICE Trans. Electron. 93-C(8): 1333-1337 (2010)

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