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"A unified system level error model of crosstalk and electromigration for ..."

Hyeonggeon Lee, Jong Kang Park, Jong Tae Kim (2017)

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DOI: 10.1587/ELEX.14.20161194

access: open

type: Journal Article

metadata version: 2021-02-12

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  dblp key:
  - journals/ieiceee/LeePK17
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  - https://dblp.org/rec/journals/ieiceee/LeePK17
Hyeonggeon Lee, Jong Kang Park, Jong Tae Kim:
A unified system level error model of crosstalk and electromigration for on-chip interconnect. IEICE Electron. Express 14(5): 20161194 (2017)

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