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"Statistical estimation of delay fault detectabilities and fault grading."

Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges (1996)

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DOI: 10.1007/BF00136075

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/ZhangMB96
Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges:
Statistical estimation of delay fault detectabilities and fault grading. J. Electron. Test. 8(1): 47-60 (1996)

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