Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Test Data Compression for System-on-a-Chip using Count Compatible Pattern ..."

Haiying Yuan et al. (2014)

> Home

Details and statistics

DOI: 10.1007/S10836-014-5441-0

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/YuanMSG14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/YuanMSG14
Haiying Yuan, Jiaping Mei, Hongying Song, Kun Guo:
Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding. J. Electron. Test. 30(2): 237-242 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.