"A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM."

Chih-Wea Wang et al. (2002)

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DOI: 10.1023/A:1020805224219

access: closed

type: Journal Article

metadata version: 2023-10-17

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Chih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin:
A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM. J. Electron. Test. 18(6): 637-647 (2002)

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