Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Analysis and Fault Modeling of Actual Resistive Defects in ATMEL ..."

Pierre-Didier Mauroux et al. (2012)

> Home

Details and statistics

DOI: 10.1007/S10836-012-5277-4

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/MaurouxVBDGPGFV12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/MaurouxVBDGPGFV12
Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez:
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTAC^TM eFlash Memories. J. Electron. Test. 28(2): 215-228 (2012)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.