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"Integration of partial scan and built-in self-test."

Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik (1995)

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DOI: 10.1007/BF00993320

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/LinZB95
Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik:
Integration of partial scan and built-in self-test. J. Electron. Test. 7(1-2): 125-137 (1995)

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