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"Built-In-Self-Testing Techniques for Programmable Capacitor Arrays."

Amit Laknaur, Sai Raghuram Durbha, Haibo Wang (2006)

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DOI: 10.1007/S10836-006-9459-9

access: closed

type: Journal Article

metadata version: 2021-09-09

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Amit Laknaur, Sai Raghuram Durbha, Haibo Wang:
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. J. Electron. Test. 22(4-6): 449-462 (2006)

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