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Amit Laknaur
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2010 – 2019
- 2016
- [c7]Bonita Bhaskaran, Amit Sanghani, Kaushik Narayanun, Ayub Abdollahian, Amit Laknaur:
Test method and scheme for low-power validation in modern SOC integrated circuits. VTS 2016: 1-6
2000 – 2009
- 2009
- [j3]Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang:
Design of a window comparator with adaptive error threshold for online testing applications. Microelectron. J. 40(9): 1257-1263 (2009) - 2007
- [c6]Rui Xiao, Amit Laknaur, Haibo Wang:
A Fully Programmable Analog Window Comparator. ISCAS 2007: 3872-3875 - [c5]Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang:
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. ISQED 2007: 501-506 - [c4]Amit Laknaur, Rui Xiao, Haibo Wang:
A Programmable Window Comparator for Analog Online Testing. VTS 2007: 119-124 - 2006
- [j2]Amit Laknaur, Sai Raghuram Durbha, Haibo Wang:
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. J. Electron. Test. 22(4-6): 449-462 (2006) - [c3]Amit Laknaur, Haibo Wang:
Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits. ISQED 2006: 531-536 - [c2]Sai Raghuram Durbha, Amit Laknaur, Haibo Wang:
Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. VTS 2006: 320-325 - 2005
- [j1]Amit Laknaur, Haibo Wang:
A methodology to perform online self-testing for field-programmable analog array circuits. IEEE Trans. Instrum. Meas. 54(5): 1751-1760 (2005) - [c1]Amit Laknaur, Haibo Wang:
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. ISQED 2005: 434-439
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