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"State and Fault Information for Compaction-Based Test Generation."

Ashish Giani et al. (2002)

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DOI: 10.1023/A:1013780023643

access: closed

type: Journal Article

metadata version: 2020-09-11

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Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal:
State and Fault Information for Compaction-Based Test Generation. J. Electron. Test. 18(1): 63-72 (2002)

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