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"Testability of 2-Level AND/EXOR Circuits."

Rolf Drechsler et al. (1999)

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DOI: 10.1023/A:1008306002882

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/et/DrechslerHSHB99
Rolf Drechsler, Harry Hengster, Horst Schäfer, Joachim Hartmann, Bernd Becker:
Testability of 2-Level AND/EXOR Circuits. J. Electron. Test. 14(3): 219-225 (1999)

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