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"Design for Testability Techniques at the Behavioral and Register-Transfer ..."

Sujit Dey, Anand Raghunathan, Kenneth D. Wagner (1998)

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DOI: 10.1023/A:1008397519162

access: closed

type: Journal Article

metadata version: 2021-10-14

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Sujit Dey, Anand Raghunathan, Kenneth D. Wagner:
Design for Testability Techniques at the Behavioral and Register-Transfer Levels. J. Electron. Test. 13(2): 79-91 (1998)

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