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"Thermal Testing of Analogue Integrated Circuits: A Case Study."

Josep Altet, André Ivanov, A. Wong (2003)

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DOI: 10.1023/A:1023717617973

access: closed

type: Journal Article

metadata version: 2020-09-11

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Josep Altet, André Ivanov, A. Wong:
Thermal Testing of Analogue Integrated Circuits: A Case Study. J. Electron. Test. 19(3): 353-357 (2003)

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