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"Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und ..."
Jürgen Steininger et al. (2012)
- Jürgen Steininger, Stefan Kuiper, Shingo Ito, Georg Schitter:
Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration. Elektrotech. Informationstechnik 129(1): 28-33 (2012)
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