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Georg Schitter
Person information
- affiliation: TU Wien, Faculty of Electrical Engineering and Information Technology, Vienna, Austria
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2020 – today
- 2024
- [j41]Jorge Rosano Nonay
, Rene Ruddenklau
, Andreas Sinn
, Jan Paul Jakobs, Jonas Berlitz, Benjamin Rödiger, Georg Schitter
:
Horizontal free-space optical link with CubeISL over 143 km. J. Opt. Commun. Netw. 16(5): 593-601 (2024) - [j40]Rene Ruddenklau
, Georg Schitter
:
Optimization of acquisition patterns for establishing inter CubeSat optical communications. J. Opt. Commun. Netw. 16(8): 814-821 (2024) - [j39]Denis Ojdanic, Christopher Naverschnigg, Andreas Sinn, Daniil Zelinskyi, Georg Schitter:
Parallel Architecture for Low Latency UAV Detection and Tracking Using Robotic Telescopes. IEEE Trans. Aerosp. Electron. Syst. 60(4): 5515-5524 (2024) - [j38]Alexander Pechhacker
, Daniel Wertjanz
, Ernst Csencsics
, Georg Schitter
:
Integrated Electromagnetic Actuator With Adaptable Zero Power Gravity Compensation. IEEE Trans. Ind. Electron. 71(5): 5055-5062 (2024) - [j37]Thomas Hackl
, Mathias Poik
, Georg Schitter
:
Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy. IEEE Trans. Instrum. Meas. 73: 1-7 (2024) - 2023
- [j36]Denis Ojdanic
, Andreas Sinn
, Christopher Naverschnigg
, Georg Schitter
:
Feasibility Analysis of Optical UAV Detection Over Long Distances Using Robotic Telescopes. IEEE Trans. Aerosp. Electron. Syst. 59(5): 5148-5157 (2023) - [j35]Ernst Csencsics
, Johannes Schlarp
, Tobias Glaser
, Tobias Wolf
, Georg Schitter
:
Reducing the Speckle-Induced Measurement Uncertainty in Laser Triangulation Sensors. IEEE Trans. Instrum. Meas. 72: 1-9 (2023) - [j34]Thomas Hackl
, Mathias Poik
, Georg Schitter
:
Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids. IEEE Trans. Instrum. Meas. 72: 1-8 (2023) - [j33]Mathias Poik
, Thomas Hackl
, Stefano Di Martino
, Martin Schober
, Jin Dang
, Georg Schitter
:
Model-Based RF Sensing for Contactless High-Resolution Voltage Measurements. IEEE Trans. Instrum. Meas. 72: 1-8 (2023) - [j32]Daniel Wertjanz
, Nikolaus Berlakovich
, Ernst Csencsics
, Georg Schitter
:
Range Extension for Large-Scale Robotic Precision 3-D Measurements in Vibration-Prone Environments. IEEE Trans. Instrum. Meas. 72: 1-7 (2023) - [c59]Daniel Wertjanz
, Thomas Kern, Ernst Csencsics, Georg Schitter:
Feedforward compensation of scan-induced disturbances for a high-precision robotic 3D measurement system. ACC 2023: 679-984 - [c58]Thomas Hackl, Mathias Poik, Georg Schitter:
Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy. I2MTC 2023: 1-5 - [c57]Mathias Poik, Thomas Hackl, Stefano Di Martino, Martin Schober, Jin Dang, Georg Schitter:
Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage Sensing. I2MTC 2023: 1-6 - [c56]Daniel Wertjanz
, Thomas Kern, Ernst Csencsics, Georg Schitter:
Robot-based measurement system for double-sided inspection of optical components. I2MTC 2023: 1-6 - [c55]Christoph Buchner, Peter Gsellmann, Martin Melik-Merkumians, Georg Schitter:
Eye-In-Hand Pose Estimation of Industrial Robots. IECON 2023: 1-6 - [c54]Peter Gsellmann, Christoph Buchner, Karin Egretzberger, Martin Melik-Merkumians, Georg Schitter:
Depth-Data-Based Object Cluster Tracking and Velocity Estimation in Robot Workspace. IECON 2023: 1-6 - [c53]Christoph Zech
, Jan Römhild, Peter Gsellmann
, Martin Melik-Merkumians
, Georg Schitter
:
Sensorless External Torque Sensing for Collision Detection in Collaborative Robots. IECON 2023: 1-6 - 2022
- [j31]Daniel Wertjanz
, Ernst Csencsics
, Georg Schitter
:
Three-DoF Vibration Compensation Platform for Robot-Based Precision Inline Measurements on Free-Form Surfaces. IEEE Trans. Ind. Electron. 69(1): 613-621 (2022) - [j30]Han Woong Yoo
, Rene Riegler, David Brunner
, Stephan Albert
, Thomas Thurner
, Georg Schitter
:
Experimental Evaluation of Vibration Influence on a Resonant MEMS Scanning System for Automotive Lidars. IEEE Trans. Ind. Electron. 69(3): 3099-3108 (2022) - [j29]Daniel Wertjanz
, Ernst Csencsics
, Thomas Kern
, Georg Schitter
:
Bringing the Lab to the Fab: Robot-Based Inline Measurement System for Precise 3-D Surface Inspection in Vibrational Environments. IEEE Trans. Ind. Electron. 69(10): 10666-10673 (2022) - [j28]Gerhard Stadler, Ernst Csencsics
, Shingo Ito
, Georg Schitter
:
High Precision Hybrid Reluctance Actuator With Integrated Orientation Independent Zero Power Gravity Compensation. IEEE Trans. Ind. Electron. 69(12): 13296-13304 (2022) - [j27]Christian Haider
, Martin E. Fuerst
, Matthias Laimer
, Ernst Csencsics
, Georg Schitter
:
Range-Extended Confocal Chromatic Sensor System for Double-Sided Measurement of Optical Components With High Lateral Resolution. IEEE Trans. Instrum. Meas. 71: 1-8 (2022) - [j26]Christopher Naverschnigg
, Ernst Csencsics
, Georg Schitter
:
Flexible Robot-Based In-Line Measurement System for High-Precision Optical Surface Inspection. IEEE Trans. Instrum. Meas. 71: 1-9 (2022) - [c52]Christian Schwaer, David Stefanek, Andreas Sinn, Georg Schitter:
Integrated Force Sensor based on Optical Distance Measurement for a Modular Actuator used in Active Optics. AIM 2022: 496-501 - [c51]Johannes Schlarp, Lukas Klemen, Ernst Csencsics, Georg Schitter:
Improving the Repeatability of a Color Sensor by Integrating an FSM for Scanning-based Areal Measurements. AIM 2022: 502-507 - [c50]Peter Gsellmann, Dominik Natter, Georg Schitter:
Collision Avoidance for a SCARA Robot on Construction Sites. AIM 2022: 508-513 - [c49]Bo Cong, Johannes Schlarp, Georg Schitter:
Iterative Learning Control for the Active Error Correction of Polygon Mirror Based Laser Scanning. AIM 2022: 522-527 - [c48]Daniel Wertjanz, Thomas Kern, Alexander Pechhacker, Ernst Csencsics, Georg Schitter:
Robotic precision 3D measurements in vibration-prone environments enabled by active six DoF sample-tracking. AIM 2022: 1441-1446 - [c47]Thomas Hackl
, Mathias Poik, Georg Schitter:
Electrostatic Actuation of AFM Cantilevers in Aqueous Solutions. AIM 2022: 1538-1542 - [c46]Martin Resetarits, Martin Melik-Merkumians, Georg Schitter:
Controlling concurrent events in IEC 61499 based systems on FPGAs. ETFA 2022: 1-4 - [c45]Ernst Csencsics, Johannes Schlarp, Tobias Glaser, Tobias Wolf, Georg Schitter:
Simulation and Reduction of Speckle-induced Uncertainty in Laser Triangulation Sensors. I2MTC 2022: 1-6 - [c44]Thomas Hackl
, Mathias Poik, Georg Schitter:
DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy. I2MTC 2022: 1-5 - [c43]Mathias Poik, Mario Mayr, Thomas Hackl
, Georg Schitter:
Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. I2MTC 2022: 1-6 - [c42]Daniel Wertjanz
, Nikolaus Berlakovich, Ernst Csencsics, Georg Schitter:
Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurements. I2MTC 2022: 1-6 - [d2]Han Woong Yoo
, Stephan Albert
, Georg Schitter
:
Supplementary materials for "Fourier Series based Analytic Model of a Resonant MEMS Mirror for General Voltage Inputs". IEEE DataPort, 2022 - 2021
- [j25]Alois Zoitl, Georg Schitter
:
Automatisierungs- und Steuerungssysteme in der Produktion. Elektrotech. Informationstechnik 138(6): 307-308 (2021) - [j24]Martin Melik-Merkumians
, Peter Gsellmann
, Georg Schitter
:
Modularisierung von Steuerungssoftware. Elektrotech. Informationstechnik 138(6): 309-314 (2021) - [j23]Shingo Ito
, Mathias Poik, Johannes Schlarp
, Georg Schitter
:
Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff. IEEE Trans. Ind. Electron. 68(1): 786-795 (2021) - [j22]David Brunner
, Han Woong Yoo
, Georg Schitter
:
Linear Modeling and Control of Comb-Actuated Resonant MEMS Mirror With Nonlinear Dynamics. IEEE Trans. Ind. Electron. 68(4): 3315-3323 (2021) - [j21]Peter Gsellmann
, Martin Melik-Merkumians
, Alois Zoitl
, Georg Schitter
:
A Novel Approach for Integrating IEC 61131-3 Engineering and Execution Into IEC 61499. IEEE Trans. Ind. Informatics 17(8): 5411-5418 (2021) - [j20]Martin E. Fuerst
, Ernst Csencsics
, Nikolaus Berlakovich
, Georg Schitter
:
Automated Measurement of Highly Divergent Optical Wavefronts With a Scanning Shack-Hartmann Sensor. IEEE Trans. Instrum. Meas. 70: 1-9 (2021) - [j19]Mathias Poik
, Dominik Kohl
, Mario Mayr
, Christoph Kerschner
, Georg Schitter
:
A Mechatronic Lock-In Amplifier: Integrating Demodulation in Sensor Electronics for Measuring Mechanical Oscillations. IEEE Trans. Instrum. Meas. 70: 1-8 (2021) - [c41]Martin Melik-Merkumians, Peter Gsellmann, Georg Schitter:
Hierarchization and Integration of IEC 61131-3 and IEC 61499 for Enhanced Reusability. ETFA 2021: 1-4 - [c40]Ines Burgstaller, Shingo Ito, Hiroshi Fujimoto, Georg Schitter
:
Development of Reluctance Actuator for High-Precision Positioning and Scanning Motion. ICM 2021: 1-6 - 2020
- [j18]Shingo Ito
, Francesco Cigarini, Georg Schitter
:
Flux-Controlled Hybrid Reluctance Actuator for High-Precision Scanning Motion. IEEE Trans. Ind. Electron. 67(11): 9593-9600 (2020) - [j17]Johannes Schlarp
, Ernst Csencsics
, Georg Schitter
:
Optical Scanning of a Laser Triangulation Sensor for 3-D Imaging. IEEE Trans. Instrum. Meas. 69(6): 3606-3613 (2020) - [c39]Johannes Schlarp
, Ernst Csencsics
, Gabriel Doblinger, Georg Schitter
:
Design of a Mechanical Tunable Resonant Fast Steering Mirror. AIM 2020: 1607-1612 - [c38]Daniel Wertjanz
, Ernst Csencsics
, Johannes Schlarp
, Georg Schitter
:
Design and control of a MAGLEV platform for positioning in arbitrary orientations. AIM 2020: 1935-1942 - [c37]Daniel Wertjanz
, Ernst Csencsics
, Georg Schitter
:
An efficient control transition scheme between stabilization and tracking task of a MAGLEV platform enabling active vibration compensation. AIM 2020: 1943-1948 - [c36]Martin E. Fuerst
, Nikolaus Berlakovich, Ernst Csencsics
, Georg Schitter
:
Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics. I2MTC 2020: 1-6 - [c35]Mathias Poik, Dominik Kohl, Mario Mayr, Christoph Kerschner, Georg Schitter
:
Efficient Demodulation for Measuring the Amplitude of Mechanical Oscillations. I2MTC 2020: 1-5 - [c34]Johannes Schlarp
, Ernst Csencsics
, Georg Schitter
:
Optically scanned laser line sensor. I2MTC 2020: 1-6 - [c33]Naoki Motoi, Mathis Nalbach, Shingo Ito, Philipp J. Thurner, Georg Schitter
:
Adaptive Control Method Based on Recursive Least Square Method by Piezoelectric Actuator for Pulling Fibril with Parameter Variation. IECON 2020: 550-555 - [d1]David Brunner
, Han Woong Yoo
, Richard Schroedter
, Georg Schitter
:
Lissajous grid projection and center pixel stability with and without synchronization control. IEEE DataPort, 2020 - [i1]Han Woong Yoo, Rene Riegler, David Brunner, Stephan Albert, Thomas Thurner, Georg Schitter:
Vibration Influence Evaluation of a Resonant MEMS Scanning System for Automotive Lidars. CoRR abs/2010.08327 (2020)
2010 – 2019
- 2019
- [j16]Shingo Ito
, Stefan Troppmair, Bernhard Lindner, Francesco Cigarini, Georg Schitter
:
Long-Range Fast Nanopositioner Using Nonlinearities of Hybrid Reluctance Actuator for Energy Efficiency. IEEE Trans. Ind. Electron. 66(4): 3051-3059 (2019) - 2018
- [j15]Ernst Csencsics
, Shingo Ito, Johannes Schlarp
, Markus Thier, Georg Schitter
:
Hochpräzise roboterbasierte 3D-In-Prozess-Messtechnik. Elektrotech. Informationstechnik 135(6): 382-388 (2018) - [j14]Matthias Bibl, Robert Stein, Egon Döberl, Georg Schitter
:
Rotierender optischer Positions- und Winkelsensor. Elektrotech. Informationstechnik 135(6): 396-400 (2018) - [j13]Han Woong Yoo, Norbert Druml, David Brunner
, Christian Schwarzl, Thomas Thurner
, Marcus Hennecke, Georg Schitter
:
MEMS-based lidar for autonomous driving. Elektrotech. Informationstechnik 135(6): 408-415 (2018) - [c32]Mathias Poik, Dominik Kohl, Georg Schitter
:
Similarity-based Feedback Control for Linear Operation of Piezoelectric Actuators. AIM 2018: 97-102 - [c31]Johannes Schlarp
, Ernst Csencsics
, Georg Schitter
:
Feature detection and scan area selection for 3D laser scanning sensors. AIM 2018: 280-285 - [c30]Shingo Ito, Georg Schitter
:
Optimal fail-safe motion using dynamic brake for Lorentz-actuated AFM. AMC 2018: 473-478 - [c29]Thomas Riel, Andràs Gàlffy, Georg Schitter
:
Analysis and Robust Control of an Precision Motion Platform Using Disturbance Compensation. CCTA 2018: 1090-1095 - [c28]Peter Gsellmann
, Martin Melik-Merkumians
, Georg Schitter
:
Comparison of Code Measures of IEC 61131-3 and 61499 Standards for Typical Automation Applications. ETFA 2018: 1047-1050 - 2017
- [j12]Matthias Wolfgang Hofmair, Martin Melik-Merkumians
, Martin Böck, Munir Merdan, Georg Schitter
, Andreas Kugi
:
Patching process optimization in an agent-controlled timber mill. J. Intell. Manuf. 28(1): 69-84 (2017) - [c27]Dominik Kohl, Christoph Kerschner, Georg Schitter
:
Automatic fourier synthesis based input-shaping for scanning piezo-electric actuators. AIM 2017: 1083-1088 - [c26]Ernst Csencsics
, Johannes Schlarp
, Georg Schitter
:
Bandwidth extension of hybrid-reluctance-force-based tip/tilt system by reduction of eddy currents. AIM 2017: 1167-1172 - [c25]Shingo Ito, Han Woong Yoo, Georg Schitter
:
Comparison of modeling-free learning control algorithms for galvanometer scanner's periodic motion. AIM 2017: 1357-1362 - [c24]Ernst Csencsics
, Georg Schitter
:
Design of a phase-locked-loop-based control scheme for Lissajous-trajectory scanning of fast steering mirrors. ACC 2017: 1568-1573 - [c23]Ernst Csencsics
, Georg Schitter
:
Parametric PID controller tuning for a fast steering mirror. CCTA 2017: 1673-1678 - [c22]Michael Steinegger, Martin Melik-Merkumians
, Georg Schitter
:
Ontology-based framework for the generation of interlock code with redundancy elimination. ETFA 2017: 1-5 - [c21]Michael Steinegger, Martin Melik-Merkumians
, Johannes Zajc, Georg Schitter
:
A framework for automatic knowledge-based fault detection in industrial conveyor systems. ETFA 2017: 1-6 - 2016
- [j11]Rene Paris, Martin Melik-Merkumians
, Georg Schitter
:
Probabilistic Absolute Position Sensor Based on Objective Laser Speckles. IEEE Trans. Instrum. Meas. 65(5): 1188-1196 (2016) - [c20]Ernst Csencsics
, Rudolf Saathof
, Georg Schitter
:
Design of a dual-tone controller for Lissajous-based scanning of fast steering mirrors. ACC 2016: 461-466 - [c19]Rudolf Saathof
, Thomas Riel, Matthias Bibl, Dominik Kohl, Han Woong Yoo, Georg Schitter
:
Non-parametric robustness analysis for feedback motion control for a high precision stage with large mass uncertainty. ACC 2016: 2611-2616 - [c18]Dominik Kohl, Thomas Riel, Rudolf Saathof
, Jürgen Steininger, Georg Schitter
:
Auto-tuning PI controller for surface tracking in atomic force microscopy - a practical approach. ACC 2016: 7396-7401 - [c17]Matthias Bibl, Michael Robin, Michael Steinegger, Georg Schitter
:
Framework for implementation of iterative learning control on programmable logic controllers. ETFA 2016: 1-4 - [c16]Martin Melik-Merkumians
, Matthias Baierling, Georg Schitter
:
A service-oriented domain specific language programming approach for batch processes. ETFA 2016: 1-9 - [c15]Michael Steinegger, Martin Melik-Merkumians
, Johannes Zajc, Georg Schitter
:
Automatic generation of diagnostic handling code for decentralized PLC-based control architectures. ETFA 2016: 1-8 - [c14]Michael Steinegger, Nikolaus Plaschka, Martin Melik-Merkumians
, Georg Schitter
:
A framework for modular and distributable control of reconfigurable robotic systems. ICIT 2016: 848-853 - 2015
- [j10]Markus Thier, Rudolf Saathof, Ernst Csencsics, Reinhard Hainisch, Andreas Sinn, Georg Schitter:
Entwurf und Regelung eines Positioniersystems für robotergestützte Nanomesstechnik. Autom. 63(9): 727-738 (2015) - [j9]Georg Schitter
:
Mess-, Automatisierungs- und Robotertechnik. Elektrotech. Informationstechnik 132(4-5): 189-190 (2015) - [c13]Shingo Ito, Daniel Neyer, Stefan Pirker, Jürgen Steininger, Georg Schitter
:
Atomic force microscopy using voice coil actuators for vibration isolation. AIM 2015: 470-475 - [c12]Rene Paris, Martin Melik-Merkumians
, Georg Schitter
:
Vision-based probabilistic absolute position sensor. I2MTC 2015: 2066-2071 - 2013
- [j8]Markus Thier, Rene Paris, Thomas Thurner
, Georg Schitter
:
Low-Latency Shack-Hartmann Wavefront Sensor Based on an Industrial Smart Camera. IEEE Trans. Instrum. Meas. 62(5): 1241-1249 (2013) - [c11]Han Woong Yoo, Shingo Ito, Michel Verhaegen, Georg Schitter
:
Transformation-based iterative learning control for non-collocated sensing of a galvanometer scanner. ECC 2013: 1204-1209 - [c10]Michael Steinegger, Alois Zoitl
, Martin Fein, Georg Schitter
:
Design patterns for separating fault handling from control code in discrete manufacturing systems. IECON 2013: 4368-4373 - 2012
- [j7]Andreas Kugi
, Georg Schitter
:
Automatisierungs- und Regelungstechnik. Elektrotech. Informationstechnik 129(1): 1-2 (2012) - [j6]Jürgen Steininger, Stefan Kuiper, Shingo Ito
, Georg Schitter
:
Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration. Elektrotech. Informationstechnik 129(1): 28-33 (2012) - [j5]Rene Paris, Thomas Thurner
, Thomas Berndorfer, Han Woong Yoo, Georg Schitter
:
Intelligente Kameras in der Messtechnik. Elektrotech. Informationstechnik 129(1): 34-41 (2012) - 2011
- [j4]Hong Song, Rufus Fraanje, Georg Schitter
, Gleb Vdovin, Michel Verhaegen:
Controller Design for a High-Sampling-Rate Closed-Loop Adaptive Optics System with Piezo-Driven Deformable Mirror. Eur. J. Control 17(3): 290-301 (2011) - 2010
- [c9]Jan Roelf van Hulzen, Georg Schitter
, Paul M. J. Van den Hof, Jan van Eijk:
Modal actuation for high bandwidth nano-positioning. ACC 2010: 6525-6530
2000 – 2009
- 2009
- [c8]Stefan Kuiper, Georg Schitter
:
Self-sensing actuation and damping of a piezoelectric tube scanner for atomic force microscopy. ECC 2009: 3887-3892 - [c7]Jan Roelf van Hulzen, Georg Schitter
, Paul M. J. Van den Hof, Jan van Eijk:
Load dynamics in piezoelectric actuation. ECC 2009: 5009-5014 - 2008
- [c6]Georg Schitter
, Nghi Phan:
Field Programmable Analog Array (FPAA) based control of an Atomic Force Microscope. ACC 2008: 2690-2695 - [c5]Georg Schitter
, Wouter F. Rijkee, Nghi Phan:
Dual actuation for high-bandwidth nanopositioning. CDC 2008: 5176-5181 - 2007
- [j3]Georg Schitter
, Karl Johan Åström, Barry E. DeMartini, Philipp J. Thurner
, Kimberly L. Turner, Paul K. Hansma:
Design and Modeling of a High-Speed AFM-Scanner. IEEE Trans. Control. Syst. Technol. 15(5): 906-915 (2007) - [c4]Daniel Y. Abramovitch, Sean B. Andersson, Lucy Y. Pao, Georg Schitter
:
A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force Microscopes. ACC 2007: 3488-3502 - [c3]Georg Schitter
:
Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time. ACC 2007: 3503-3508 - 2006
- [c2]Georg Schitter
, Karl Johan Åström, Barry E. DeMartini, Georg E. Fantner, Kimberly L. Turner, Philipp J. Thurner, Paul K. Hansma:
Design and modeling of a high-speed scanner for atomic force microscopy. ACC 2006 - 2005
- [j2]Andreas Stemmer, Georg Schitter
, Jochen M. Rieber, Frank Allgöwer
:
Control Strategies Towards Faster Quantitative Imaging in Atomic Force Microscopy. Eur. J. Control 11(4-5): 384-395 (2005) - 2004
- [j1]Georg Schitter
, Andreas Stemmer:
Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy. IEEE Trans. Control. Syst. Technol. 12(3): 449-454 (2004) - 2003
- [c1]Georg Schitter, Andreas Stemmer, Frank Allgöwer:
Robust 2 DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy. ACC 2003: 3720-3725
Coauthor Index
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