"The Future of Design for Test and Silicon Lifecycle Management."

Janusz Rajski et al. (2024)

> Home

SPARQL queries

Details and statistics

DOI: 10.1109/MDAT.2023.3335195

access: closed

type: Journal Article

metadata version: 2024-08-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/dt/RajskiCCEMT24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/RajskiCCEMT24
Janusz Rajski, Vivek Chickermane, Jean-François Côté, Stephan Eggersglüß, Nilanjan Mukherjee, Jerzy Tyszer:
The Future of Design for Test and Silicon Lifecycle Management. IEEE Des. Test 41(4): 35-49 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.