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"Test Generation Methods for Utilization Improvement of ..."

Wisam Kadry et al. (2017)

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DOI: 10.1109/MDAT.2016.2527998

access: closed

type: Journal Article

metadata version: 2020-03-13

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  dblp key:
  - journals/dt/KadryKMNSPPJS17
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  persistent URL:
  - https://dblp.org/rec/journals/dt/KadryKMNSPPJS17
Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae-Cheol Son:
Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms. IEEE Des. Test 34(1): 65-76 (2017)

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