"High-Bandwidth Memory (HBM) Test Challenges and Solutions."

Hongshin Jun et al. (2017)

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DOI: 10.1109/MDAT.2016.2624283

access: closed

type: Journal Article

metadata version: 2020-03-13

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Hongshin Jun, Sang Kyun Nam, Han Ho Jin, Jong-Chern Lee, Yong Jae Park, Jaejin Lee:
High-Bandwidth Memory (HBM) Test Challenges and Solutions. IEEE Des. Test 34(1): 16-25 (2017)

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