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"Generating Tests for Delay Faults in Nonscan Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth (1993)

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DOI: 10.1109/54.199801

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/AgrawalAS93
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  persistent URL:
  - https://dblp.org/rec/journals/dt/AgrawalAS93
Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth:
Generating Tests for Delay Faults in Nonscan Circuits. IEEE Des. Test Comput. 10(1): 20-28 (1993)

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