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"A New Behavioral Model of Gate-Grounded NMOS for Simulating Snapback ..."
Yize Wang, Guangyi Lu, Yuan Wang (2020)
- Yize Wang, Guangyi Lu, Yuan Wang:
A New Behavioral Model of Gate-Grounded NMOS for Simulating Snapback Characteristics. IEEE Access 8: 64730-64738 (2020)
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