"Influence of Punch Trough Stop Layer and Well Depths on the Robustness of ..."

Antonio Calomarde et al. (2022)

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DOI: 10.1109/ACCESS.2022.3171813

access: open

type: Journal Article

metadata version: 2023-07-06

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Antonio Calomarde, Salvador Manich, Antonio Rubio, Francisco Gámiz:
Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact. IEEE Access 10: 47169-47178 (2022)

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