"Satisfiability-Based Automatic Test Program Generation and Design for ..."

Loganathan Lingappan, Niraj K. Jha (2007)

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DOI: 10.1109/TVLSI.2007.896908

access: closed

type: Journal Article

metadata version: 2020-03-11

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Loganathan Lingappan, Niraj K. Jha:
Satisfiability-Based Automatic Test Program Generation and Design for Testability for Microprocessors. IEEE Trans. Very Large Scale Integr. Syst. 15(5): 518-530 (2007)

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