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"Minimizing Test Time in Arithmetic Test-Pattern Generators With ..."

Salvador Manich, Lucas Garcia-Deiros, Joan Figueras (2007)

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DOI: 10.1109/TCAD.2007.906465

access: closed

type: Journal Article

metadata version: 2023-03-15

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Salvador Manich, Lucas Garcia-Deiros, Joan Figueras:
Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(11): 2046-2058 (2007)

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