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"Comparison of thermal runaway limits under different test conditions based ..."

Paula Diaz Reigosa et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.025

access: closed

type: Journal Article

metadata version: 2022-10-02

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Paula Diaz Reigosa, Daniel Prindle, Gontran Pâques, Silvan Geissmann, Francesco Iannuzzo, Arnost Kopta, Munaf Rahimo:
Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. Microelectron. Reliab. 64: 524-529 (2016)

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