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ORCID"Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI ..."
Chih-Wen Lu et al. (2002)
- Chih-Wen Lu, Chung-Len Lee, Chauchin Su, Jwu-E Chen:
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing. J. Electron. Test. 18(1): 89-97 (2002)
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