Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design."

Yu Cao, Jim Tschanz, Pradip Bose (2009)

> Home

Details and statistics

DOI: 10.1109/MDT.2009.149

access: closed

type: Journal Article

metadata version: 2021-04-15

- view
  authority control:
- export record
  dblp key:
  - journals/dt/CaoTB09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/CaoTB09
Yu Cao, Jim Tschanz, Pradip Bose:
Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design. IEEE Des. Test Comput. 26(6): 6-7 (2009)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.