"Estimation of delay test quality and its application to test generation."

Seiji Kajihara et al. (2007)

> Home

Details and statistics

DOI: 10.1109/ICCAD.2007.4397300

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/iccad/KajiharaMYWFHA07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/KajiharaMYWFHA07
Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo:
Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.