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"Physics-based full-chip TDDB assessment for BEOL interconnects."

Xin Huang et al. (2016)

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DOI: 10.1145/2897937.2898062

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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Xin Huang, Valeriy Sukharev, Zhongdong Qi, Taeyoung Kim, Sheldon X.-D. Tan:
Physics-based full-chip TDDB assessment for BEOL interconnects. DAC 2016: 45:1-45:6

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