"Flash Memory Built-In Self-Diagnosis with Test Mode Control."

Jen-Chieh Yeh et al. (2005)

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DOI: 10.1109/VTS.2005.45

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  persistent URL:
  - https://dblp.org/rec/conf/vts/YehLSWHL05
Jen-Chieh Yeh, Yan-Ting Lai, Yuan-Yuan Shih, Cheng-Wen Wu, Chien-Hung Ho, Yen-Tai Lin:
Flash Memory Built-In Self-Diagnosis with Test Mode Control. VTS 2005: 15-20

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